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Digging a lot Deeper With Unit Retest | ICBB PDF download and PDF Dumps

maintaining check costs flat in the face of product complexity continues to problem each product and look at various engineers. extended records assortment at kit-stage check and the capacity to reply to it in a by no means-before degree of element has brought on device makers and assembly and verify houses to tighten up their retest methods.

look at various metrology, socket contamination, and mechanical alignment have always been the groundwork for kit retest, and when parts don’t flow these assessments instantly retest happens as a minimum once. however unlike during the past, facts analytic structures now permit look at various and product engineers to appear greater deeply on the complete retest process. moreover, wise manufacturing investments in meeting and examine homes have extended their potential to greater impulsively respond to information generated from each examine telephone equipment and device data. All of here's making the retest system extra informative and stringent.

meeting and look at various factories usually have reader boards to demonstrate all employees the variety of instruments shipped, reinforcing an expectation for top yields after a die is assembled into a kit. A yield of 99.5% isn't unusual for a high-volume buyer electronics product, and for a long time retesting has been regarded a means to nudge that yield upward with the aid of improving decent ingredients marked as failed and to generate greater ingredients in a bin split for a particular parameter similar to low vigour.

commonly, an expectation of yield recuperation is warranted because of such factors as contact resistance. Unit-degree checking out requires the equal extremely good intermetallic contact as a wafer probe. The same metallurgical and mechanical attributes for inserting a tool beneath verify (DUT) right into a contactor that interfaces with an ATE exist for ultimate examine, as well. these attributes make contributions to contact resistance, which in flip affects test outcomes.

For kit retest, in specific, performance-primarily based tests commonly can be accomplished only at the unit stage. If the machine necessities are on the edge of the ATE’s measurement ability, retest may additionally Strengthen an element it's technically respectable.

“On equipment verify, it’s very general to retest all forms of parameters, and it’s just about like verify except pass,” referred to Keith Schaub, vice chairman of expertise and method at Advantest the us. “originally glance this seems illogical. It failed, so it is going to remain a failed part. but there are loads of circumstances where you're checking out on the very restrict of the tester. In these situations, retest of a failed unit will turn into an outstanding unit, and it’s legitimate.”

So how many retests are adequate to make sure valid respectable elements? “There will also be lots of retest of packaged devices,” mentioned Stéphane Iung, senior supervisor purposes silicon lifecycle analytics at Synopsys. “The retest expense is relatively excessive at remaining verify in comparison to a wafer. it's some thing that their shoppers are very thinking about when it comes to charge and high-quality.”

but with superior statistics analytic options for semiconductor manufacturing test engineering teams can turn into more nuanced in their knowing of the influence of retest.

The why and approaches of retestWafer verify filters out a high percentage of fab-caused manufacturing defects and method variability. At remaining check, engineers focus their displays for packaging-related defects and efficiency binning. for prime-quantity products, that regularly comprises temperature-sensitive defects.

“At closing verify, the basic assumption is that a huge fraction of the first-pass yield loss will be check procedure-linked, so then it can be recovered,” mentioned Iung. “So systematically, closing check fails, they go into retest. If the primary retest fails, they go into secondary test. Then, with appreciate to what number of retests, it depends on the coverage of the particular person business.”

Retest of a packaged equipment can occur in a lot of situations, including:

  • As a part of the check size manner;
  • all the way through the examine software;
  • In-situ with the first physical dealing with of the unit lot measurement, relocating failed or down-binned materials to a unique examine telephone, and
  • during first-rate assurance checking out it is required on a pattern of decent elements.
  • Fig. 1: Retest possibilities. Source: Semiconductor Engineering/Anne Meixner

    Fig. 1: Retest possibilities. Source: Semiconductor Engineering/Anne Meixner

    Fig. 1: Retest possibilities. source: Semiconductor Engineering/Anne Meixner

    for many gadgets this retest system relies on each the design margin to a look at various move/fail restrict, the ATE’s instrument measurement ability and the verify telephone equipment reliably developing an excellent exceptional contact.

    The expanding variety of parametric measurements made for devices that support 4G/5G and security important functions like automobile and scientific can even be at the edge of a circulate/fail limit set. each ATE capabilities and design margin play a roll in being at the aspect.

    “On most analog gadgets it’s very usual to operate retest of parametric size, and here's especially true for the decrease signal stages, i.e., 10 millivolts,” referred to Advantest’s Schaub. “The reduce the sign degree, the greater retest is performed as part of the dimension method. You should do lots of averaging of verify measurements for these very low signal ranges. believe this takes 10 seconds. no one will pay for that amount of look at various time. So most of the time, good components flow on the first test. consider 10% of the decent constituents are not going to circulate. When suitable, they look at various a 2d time, and these decent elements pass.”

    akin to the ATE instrumentation being pushed to its metrology limits, a device may be close to a circulate/fail restrict.

    “consider a product has parametric distributions with tight limits. What you see in marginal components is they fail the primary time, after which you retest the half it passes and you've got recovered it,” referred to Synopsys’ Iung. “Yet an absence of reproducibility of the measurement displays that its recuperation is unintentionally. With retest as soon as and improve, this may be not such a large problem. but when you beginning to retest repeatedly, in effect you're widening your limits.”

    Most recovered devices happen with new insertion of a unit into the burden board or into a unique verify mobile. Such restoration elements to the electro-mechanical nature of examine and how the issues can regularly be remediated with the aid of the re-socketing.

    contamination, edition, and stressTest machine applies the mechanical forces that assures an intermetallic contact between the DUT and the ATE. comparable to wafer probe test system, a physical alignment is required to correctly situate the unit right into a socket on a load board. To make the genuine connection to the ATE, a spring-activated pin completes the electrical connection between the DUT and the ATE.

    Contact resistance, or Cres, provides a metric to investigate the first-rate of the contact.

    “essentially, the same physics of infection happens at each wafer and final check, and this either raises Cres or creates a full open,” said Ira Feldman, fundamental consultant at Feldman Engineering and accepted chair of TestConX. “This creates variability within the contact, and routinely a rise in force will eliminate the variety. usually, one would raise the force because most contacts have a drive versus displacement curve. The additional you displace it, the drive rises predominately in an exponential manner.”

    simply as too plenty force can harm circuitry beneath a die pad/ball, the same holds authentic for kit look at various.

    “What’s least understood in regards to the position and affect for unit socket is the interplay between genuine stress on the active circuits all the way through examine relative to the closing software assembly atmosphere and its affect on lengthy-time period reliability,” mentioned George Harris, vp of global verify services at Amkor expertise.

    With a big enhance in Cres, engineers first seem to be to illness in the socket. via retesting after reinserting the unit, the part is recovered. however a rise in force to in the reduction of Cres also can be due to mechanical alignment.

    “The interplay between the diverse features of the mechanical equipment stack can translate to an over-confined device if not approached holistically,” talked about Dan Campion, director and universal supervisor of high-efficiency contactors at Cohu. “You need to agree with the connection between the handler, change kit on the handler, and the way that interfaces with the socket, equipment adaptations for the DUT within the socket, and the probe element, which makes the contact between the DUT and tester PCB pads.”

    contamination of the physical contact between the DUT and socket is the most likely offender, which in turn requires cleansing of the sockets if there is a high level of retest. Repeated insertions of gadgets into the socket generates debris and wears down the steel surfaces of the contact mechanism. The ensuing boost in touch resistance then boosts the retest cost, and at a certain threshold verify operations require a cleaning step for the weight board/socket.

    the character of the equipment, contactor, and handler gadget dictate the cleaning manner. Monitoring a couple of parameters can exhibit the frequency of cleansing required to manage each average equipment efficiency (OEE) and anticipated yield values. This can be detected by means of monitoring key check measurements that indicate greater than desired contact resistance, as well as statistical bin limits. There are also a large number of look at various process parameters that check factories can computer screen.

    “verify approaches that need to be monitored include temperature handle, exterior forces on the package, electrical and thermal contact performance over time, material coping with accuracy — movement accuracy X, Y, Z, and rotation — as well as electrical contact resistance, web site-to-web site diversifications, genuine dimension of the probing cloth (length/width and measurement min/max), planarity, alignment, spring traits over time, and re-socket count for ball or pad affects,” spoke of Amkor’s Harris.

    Analytics and retestWhether identifying the supply of variability in a fleet of verify cells, or the poor yield restoration in a mature product, engineers and technicians use obtainable records to determine how this is going on. information from yield management methods and manufacturing execution systems are the primary platforms to be used. These same structures also can be used to enrich average verify efficiency and control expenses.

    Harris stated that an information analytics platform can deliver his engineering staff the potential to examine yield healing and retest. they could accept as true with the following questions:

  • what is the have an effect on of the product fitness indications, similar to re-examine success rates vs. can charge or product test stress limits?
  • what is the hazard of performance binning under distinctive use conditions?
  • what's the charge have an effect on?
  • what's the hazard of retest if the first-flow “fail” turned into true, then “curative” happened all through that first-flow influence and then with a re-verify “flow,” and later a top quality reliability failure occurs within the container from defect re-growth?
  • It’s easy to get rather nuanced with the styles of ultimate verify technique considerations that may also be investigated. “Product engineers should check for web page-to-website variance. They additionally should be able to seek ‘by no means take place’ events like piggy-backing (stuck equipment/unit in handler),” said Greg Prewitt, director of Exensio solutions at PDF solutions. “furthermore, they need to look for contactor caused failures — checking out that damages the gadget and would require retest.”

    This refinement in the retest method comprises asking if all assessments should be retested.

    “if you analyze the restoration quotes of hard bins, or even gentle bins, you can examine the ROI of retesting,” talked about Iung. “think a certain fail bin doesn’t get well neatly — let’s say only in 5% of the cases. Then the test charge isn’t even worth it to recover the half. it is extra costly to retest than the gain that you will get. You also can have bad ROI, as an instance, if the recovery fee changed into 1%.”

    Advantest’s Schaub highlighted yet another aspect of the use of information to research retest alternate options. “one of the vital things which you can do with all of this information is that you would be able to get a prediction on the retest. So instead of simply retesting to get well, which you could ship some outdated product information plus the reside statistics over to the mannequin. And the model gives you lower back a prediction on whether remember to retest or now not. here's simply an operational development, which could store loads of test time and therefore can charge. For instruments that don’t need it, simply don’t do it. What frequently occurs is you fix the variety of retests — for instance three — and if on the third verify the gadget doesn’t flow, it is marked a fail. however possibly the prediction states here's an excellent equipment and it'll circulate in a client device. So now you’re throwing away a superb device.”

    The genuine smash-even element for retest per look at various category would rely on machine cost, gadget manufacturing can charge (together with all verify charges), the delivered charge of retest, and check fallout to a selected test bin and the recuperation fee.

    ConclusionToday, retesting a packaged unit at the least once is commonly automated. This decades historic apply has been motivated by means of the realities of the electromechanical environment of unit insertion, and pushing ATE instrumentation to its specification limits. Yet with ongoing considerations on operation efficiencies, the cost of retest and customer great engineers and their administration are starting to ask no matter if that retest in reality may still be automated.

    “Retest is a essential a part of the test operations method, however the surest price of retest is how it impacts yield and pleasant,” noted PDF solutions’ Prewitt. “Maximizing the price of retest is contingent on the means to create and follow clever retest guidelines all over wafer probe and ultimate test. using these suggestions to quickly and accurately establish deterministic operational considerations and take immediate motion is what makes it possible for semiconductor businesses to efficiently reduce escapes and supply higher best parts to their end valued clientele.”

    With better information from gadget and product coupled with an analytics platform that comprehends semiconductor check, engineering groups can create a greater equal yield/can charge/pleasant triangle.

    connected storiesManaging Wafer RetestDealing with dissimilar wafer touchdowns requires records analytics and mechanical engineering finesse.

    testing greater To raise ProfitsWith efficiency binning, chipmakers income extra from test.




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